Vol. 12, issue 02, article # 13
Copy the reference to clipboard
Abstract:
It is shown that the measuring base of an instrument testing a large-aperture surface shape by the overlap-scanning method can be considered as a filter of spatial frequencies. In this case, the complex amplitude of the filter is described by a function with parameters depending on the measuring base length and configuration of the instrument. Some results supporting appropriateness of this model in practice are presented.