Том 30, номер 04, статья № 10
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Аннотация:
Контуры спектральных линий для малых смещенных частот используются при обработке экспериментальных спектров в решении обратной задачи вычисления столкновительных параметров контура [1]. Их различия обусловлены разными физическими условиями (сильные / слабые столкновения, большие / малые давления и др.). Множество различных контуров применяется для исследования параметров спектральных линий молекул диоксида углерода, метана, метилгалидов и т.д. При систематизации параметров спектральных линий разнообразие контуров приводит к усложнению структур данных в информационных системах (ИС) и структур индивидов, используемых для описания свойств спектральных данных, характеризующих контур линии, в онтологиях молекулярной спектроскопии.
Дана краткая классификация контуров линий и их параметров, приведены результаты систематизации спектральных данных, относящихся к разным контурам спектральных линий, используемых при обработке спектров молекулы диоксида углерода. Для загрузки измеренных и рассчитанных параметров контуров спектральных линий, встречающихся в цифровой библиотеке ИС W@DIS, построена система импорта соответствующих спектральных данных. Разработано программное обеспечение для автоматического описания свойств импортированных решений. Основные свойства данных, формируемые в системе ИС W@DIS, связаны с описанием результатов анализа качества импортированных данных.
Ключевые слова:
классификация контуров спектральных линий, профили спектральных линий диоксида углерода, информационная система W@DIS
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