Analysis of a lateral shear interferometer based on double-exposure recording of a hologram of a focused image of a matted screen with two successive Fourier transforms is analyzed. It is shown theoretically and experimentally that spatial filtering in the plane of the hologram enables checking a lens or objective over the field, and spatial filtering in the far diffraction zone or in the plane of the image of the pupil of the lens or objective makes it possible to record the interference pattern characterizing the phase distortions introduced in the wave illuminating the matted screen and in the reference wave by the aberrations of the optical systems forming them.
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